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  Using Metrics to Maximize Software Quality:  
  An Interview with Dr. Stephen Kan of IBM  
       
       
  1. An Interview with Dr. Stephen Kan, IBM Senior Technical Staff  
2. Take Measurement, Reliability, and Validity Seriously
3. Don't Take Anything for Granted with LOC Related Metrics
4. Site of the Week
5. Book of the Week
6. Archives
7. Call To Papers!
8. FAQ
   
   
Quote of the Week

“If I am walking with two other men, each of them will serve as my teacher. I will pick out the good points of the one and imitate them, and the bad points of the other and correct them in myself."

-Confucius, philosopher and teacher (c. 551-478 BCE)

   
   
  SPONSOR  
  The IT Metrics and Productivity Journal is sponsored by CAI, world leader in IT performance, productivity, and process.  
  www.compaid.com  
     
     
   

  

Using Metrics to Maximize Software Quality: 
A CAI State of the Practice Interview with Dr. Stephen Kan of IBM
 
1. A CAI State of the Practice Interview with Dr. Stephen Kan, IBM Senior Technical Staff

Dr. Stephen H. Kan is a Senior Technical Staff Member (STSM) and a technical manager in programming at IBM in Rochester, Minnesota. He is responsible for the Quality Management Process in software development for IBM’s eServer iSeries. Dr. Kan is the author of the book Metrics and Models in Software Quality Engineering, numerous technical reports, and articles and chapters in professional journals. He established the CMM strategy for the iSeries software organization and led the process improvement effort with a core team in achieving CMM Level 5 assessment in 2004. Our interview with Dr. Kan took place in August of 2005.

Click Here to Read the Article!
 
2. Take Measurement, Reliability, and Validity Seriously
This article by Dr. Stephen Kan of IBM provides an introduction to the concepts of reliability and validity. According to Dr. Kan, reliability and validity are the two most important issues in measurement quality. They should be well thought through before a metric is proposed and implemented. (3 pages)
Click Here to Read the Article!
 
3. Don't Take Anything For Granted When Using LOC (Lines of Code) Related Metrics

Lines of code (LOC) related metrics are anything but simple. The major problem stems from the ambiguity of the actual counting methods, both within and across different languages. This article by Dr. Stephen Kan of IBM highlights some of the factors that render LOC metrics risky and misleading while offering a simple, practical approach for extracting meaningful value from them and mitigating these risks. (4 pages)

Click Here to Read the Article!
 
4. Site of the Week
The 16th IEEE Symposium on Software Reliability Engineering: November, 2005
 
5. Book of the Week
 
Metrics and Models in Software Quality Engineering by Dr. Stephen Kan
 

From the Back Cover: "Metrics and Models in Software Quality Engineering is the definitive book on this essential topic of software development. Comprehensive in scope with extensive industry examples, it shows how to measure software quality and use measurements to improve the software development process. Four major categories of quality metrics and models are addressed: quality management, software reliability and projection, complexity, and customer view. In addition, the book discusses the fundamentals of measurement theory, specific quality metrics and tools, and methods for applying metrics to the software development process. New chapters bring coverage of critical topics, including:

  • In-process metrics for software testing
  • Metrics for object-oriented software development
  • Availability metrics
  • Methods for conducting in-process quality assessments and software project assessments
  • Dos and Don'ts of Software Process Improvement, by Patrick O'Toole
  • Using Function Point Metrics to Measure Software Process Improvement, by Capers Jones

In addition to the excellent balance of theory, techniques, and examples, this book is highly instructive and practical, covering one of the most important topics in software development- quality engineering.

 
Click Here to Read More or to Buy the Book!
 
6. Archives
Special Edition! Interview with Dr. Michael Cusumano, MIT Sloan School of Management
Special Edition! Interview with Dr. Herb Krasner, University of Texas and Krasner Consulting
Special Edition! Interview with Capers Jones, Chief Scientist Emeritus of SPR
Special Edition! Interview with Joseph McMakin, former CIO of Air Products and Chemicals
Special Edition! Interview with Tom Love, CEO and Author of Software Pilots
Standard Software Processes: 3 Easy Pieces for Getting You Started!
Software Estimation: What You Can Do To Make a Difference TODAY!
How Six Sigma Applies to Software Development and IT: A Special Edition Interview wth Gary Gack
Reaping What You Sow: How to Get the Most Out of Software Metrics
 
7. Call to Papers!
CAI is announcing a call to papers and presentations on the theme of "Performance and Measurement in Software Development and Maintenance." Suggested topic areas covered include Productivity, Project Management, Estimation, Measurement, Requirements Management, Risk Management, Process Definition, Process Improvement, Benchmarking, Future Technologies, and more! Due date for all proposals is October 31, 2005.
Click Here For More Details!
 
8. FAQ
What is the IT Metrics & Productivity Journal?  
The IT Metrics and Productivity Journal is a FREE weekly eZine that covers Best Practices in Software Development, Software Maintenance, and Software Management.
 
What specifically does the Journal offer?
Each week you will receive 3 articles on any of our 5 main theme areas (Process, Metrics, Estimation, IT Governance, Education and Training) along with easy to read abstracts plus related website recommendations, book reviews, interviews with world IT leaders, and even promotional giveaways.
 
OK. I'm interested. How do I subscribe?
If you would like to receive a free issue of the IT Metrics and Productivity Journal each week and are not already a subscriber please register at the link below (Register today and you'll be eligible for a free iPod Mini!).
www.compaid.com/subscribe
 
Is there a way to get more information?
For more information on software best practices, CAI, or the IT Metrics and Productivity Institute please contact Mike Milutis, the IT Metrics & Productivity Journal Editor, at: michael_milutis@compaid.com
 
Who is the Journal's Sponsor?
This issue of the IT Metrics and Productivity Journal is sponsored by CAI, world leader in IT performance, productivity, and process.
www.compaid.com
 
 
 
For more information on software best practices, CAI, or the ITMPI please contact Michael Milutis, the
IT Metrics and Productivity Journal Editor, at michael_milutis@compaid.com